New article: Nanophotonic Force Microscopy: Characterizing Particle-Surface Interactions Using Near-Field Photonics
Article: Schein, P; Kang, P; O’Dell, D; Erickson, D; (2015) “Nanophotonic Force Microscopy: Characterizing Particle-Surface Interactions Using Near-Field Photonics”, Nano Letters,15 (2):1414-1420 DOI Abstract: Direct measurements of particlesurface interactions are important for characterizing the ...
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